versity of Applied Sciences. Founded
in 2008 by Professor Heuermann, the
company’s NonLin-S product performs
calibrated complex nonlinear measurements with a multi-port-VNA from
R&S, Agilent or Anritsu (ZVA, ZVB,
ENA, PNA, or Anritsu). The system
supports IM measurements, mixer measurements, harmonic measurements,
sampling oscilloscope measurements
and spectrum analyzer measurements.
PORT 2 PORT 4
Fig. 6 Block diagram of standard ZVxPlus configuration.
these test benches, manages measured data and model extraction with
direct links to RF EDA tools (ADS,
MWO). They are currently among the
few independent companies providing X-parameters characterization and
PHD model extraction services.
Other firms offering nonlinear de-
vice characterization include Mod-
elithics (DC and pulsed I/V, load-/
source-pull, compact model and X-pa-
rameter extraction), which was found-
ed in 2001 by Lawrence Dunleavy and
Thomas Weller, and Auriga Measure-
ments Systems LLC (DC and pulsed
I/V, load-/source-pull, compact model),
which was founded in 2004 by Yusuke
Tajima. Auriga also manufactures and
sells custom Automated Test Equip-
ment (ATE) for device modeling.
For further analysis and circuit
design, the X-parameters, S-functions,
Cardiff models, etc. from the measurement system (Agilent, NMDG/
R&S, HFE/Anritsu and/or Tektronix/
Mesuro) must operate with a simulator that supports RF/microwave models and analyses, i.e. Agilent EEsof
ADS, Genesys or AWR’s Microwave
Office (MWO). With four different
measurement systems extracting models based upon different techniques,
there is a need for a common model
file format support that reaches across
measurement and simulation platforms. This well-recognized need has
spawned two approaches.
Since Agilent produces both measurement system and design software, they have developed the capa-
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Phone: +1 410 910 78 00